Conventional FEG-SEM*

 Microanalysis X-Ray EDS


 FIB/Cross Section*, TEM lamellae preparation

 Conventional optical Microscopy** 

 Sputter coating/ carbon coating

 TEM sample preparation (non-biological)

 TEM Sample preparation (biological)

 TEM sample preparation with staining

 Technical report, bibliography

 Training on Dual Beam

 Slide scan***















* Dual Beam Nova NanaLab 600i

** Olympus BX61; Stereo Leica MZ 7,5

***Aperio Scan scope XT


Whether you are interested in Electron or optical Microscopy advanced service please contact us to discuss your requests: This email address is being protected from spambots. You need JavaScript enabled to view it.